Comparison of single-event upset generated by heavy ion and pulsed laser. - Bin Liang; Ruiqiang Song; Jianwei Han; Yaqing Chi; Rui Chen; Chunmei Hu; Jianjun Chen; Yingqi Ma; Shipeng Shangguan (Sci. China Inf. Sci., 2017)

Study on the single-event upset sensitivity of 65-nm CMOS sequential logic circuit. - Sai Li; Jianwei Han; Rui Chen; Shipeng Shangguan; Yingqi Ma; Xuan Wang (IEICE Electron. Express, 2020)

Single event effect mechanism study in 130nm fully depleted SOI technology devices. - Rui Chen; Ziyu Wang; Sai Li; Jianwei Han; Yanan Liang; Qian Chen; Shipeng Shangguan; Runjie Yuan (IEICE Electron. Express, 2024)