The influence of microwave pulse width on the thermal burnout effect of a PIN diode limiting-amplifying system. - Shipeng Yi; Zhengwei Du (Microelectron. Reliab., 2017)

The influence of microwave pulse width on the thermal burnout effect of an LNA constructed by a GaAs PHEMT. - Shipeng Yi; Zhengwei Du (Microelectron. Reliab., 2018)

The influence of microwave pulse repetition frequency on the thermal burnout effect of a PIN diode limiting-amplifying system. - Shipeng Yi; Zhengwei Du (Microelectron. Reliab., 2018)