Diagnosis of Multiple Scan Chain Timing Faults. - Wei-Shun Chuang; Shiu-Ting Lin; Wei-Chih Liu; James Chien-Mo Li (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2008)

DFT and Minimum Leakage Pattern Generation for Static Power Reduction During Test and Burn-In. - Wei-Chung Kao; Wei-Shun Chuang; Shiu-Ting Lin; Chien-Mo James Li; Vasco Manquinho (IEEE Trans. Very Large Scale Integr. Syst., 2010)