A Near-Threshold Soft Error Resilient 7T SRAM Cell with Low Read Time for 20 nm FinFET Technology. - Rahebeh Niaraki Asli; Shiva Taghipour (J. Electron. Test., 2017)

Aging comparative analysis of high-performance FinFET and CMOS flip-flops. - Shiva Taghipour; Rahebeh Niaraki Asli (Microelectron. Reliab., 2017)

Impact of Negative Bias Temperature Instability on Gate-All-Around Flip-Flops. - Shiva Taghipour; Rahebeh Niaraki Asli (J. Electron. Test., 2019)