p-HEMT with tailored field. - Samson Mil'shtein; Peter Ersland; Shivarajiv Somisetty; C. Gil (Microelectron. J., 2003)

Reliability investigation and characterization of failure modes in Schottky diodes. - Shivarajiv Somisetty; Peter Ersland; Xinxing Yang; Jason Barrett (Microelectron. Reliab., 2006)

Reliability validation of compound semiconductor foundry processes. - Peter Ersland; Shivarajiv Somisetty (Microelectron. Reliab., 2012)