Two-dimensional transient simulations of the self-heating effects in GaN-based HEMTs. - Yamin Zhang; Shiwei Feng 001; Hui Zhu; Jianwei Zhang 006; Bing Deng (Microelectron. Reliab., 2013)

Thermal investigation of LED array with multiple packages based on the superposition method. - Dong Shi; Shiwei Feng 001; Yamin Zhang; Yanbin Qiao; Bing Deng (Microelectron. J., 2015)

The effect of external stress on the electrical characteristics of AlGaN/GaN HEMTs. - Kun Liu; Hui Zhu; Shiwei Feng 001; Lei Shi; Yamin Zhang; Chunsheng Guo (Microelectron. Reliab., 2015)

All-digital thermal distribution measurement on field programmable gate array using ring oscillators. - Yuan Yue; Shiwei Feng 001; Chunsheng Guo; Xin Yan; Rui-Rui Feng (Microelectron. Reliab., 2015)

The effect of external stress on the properties of AlGaAs/GaAs single quantum well laser diodes. - Hui Zhu; Kun Liu; Cong Xiong; Shiwei Feng 001; Chunsheng Guo (Microelectron. Reliab., 2015)

Identifying the spatial position and properties of traps in GaN HEMTs using current transient spectroscopy. - Xiang Zheng; Shiwei Feng 001; Yamin Zhang; Junwei Yang (Microelectron. Reliab., 2016)

Influence of heat source size on thermal resistance of AlGaN/GaN HEMT. - Chunsheng Guo; Ju Meng; Zhiheng Liao; Shiwei Feng 001; Xun Wang; Lin Luo (ASICON, 2017)

Optimized thermal sensor allocation for field-programmable gate array temperature measurements based on self-heating test. - Jingwei Li; Shiwei Feng 001; Yamin Zhang; Chao Wang; Xin He (Microelectron. J., 2017)

Thermal evaluation of GaN-based HEMTs with various layer sizes and structural parameters using finite-element thermal simulation. - Zhiheng Liao; Chunsheng Guo; Ju Meng; Boyang Jiang; Li Gao; Ya Su; Ruomin Wang; Shiwei Feng 001 (Microelectron. Reliab., 2017)

Build-in compact and efficient temperature sensor array on field programmable gate array. - Sheng Wang; Shiwei Feng 001; Yuxuan Xiao; Chaoxu Hu; Shijie Pan (Microelectron. J., 2021)

A numerical calibration of structure-function transient thermal measurement based on Cauer RC network. - Kun Bai; Shiwei Feng 001; Xuan Li; Shijie Pan; Xiaozhuang Lu; Zhihong Feng; Yamin Zhang (Microelectron. J., 2023)

Research on Transient Temperature Rise Measurement Method for Semiconductor Devices Based on Photothermal Reflection. - Xianwei Meng; Meng Zhang; Kun Duan; Xiang Zheng; Yuwei Zhai; Shiwei Feng 001; Yamin Zhang (IEEE Trans. Instrum. Meas., 2023)

Temperature rise detection in GaN high-electron-mobility transistors via gate-drain Schottky junction forward-conduction voltages. - Xiujuan Huang; Chunsheng Guo; Qian Wen; Shiwei Feng 001; Yamin Zhang (Microelectron. J., 2024)

Automatic in-situ measurement of thermal resistance for GaN HEMTs. - Zhanwu Yao; Shiwei Feng 001; Xuan Li; Kun Bai; Xiaozhuang Lu; Binyu You; Shijie Pan; Yamin Zhang (Microelectron. J., 2024)

A Trap Characterization System for GaN HEMTs Based on Transient Drain Voltage. - Shijie Pan; Shiwei Feng 001; Xuan Li; Kun Bai; Xiaozhuang Lu; Xiang Zheng; Zixuan Feng; Yamin Zhang (IEEE Trans. Instrum. Meas., 2024)

Workload variation compensation optimization of ring oscillator temperature measurement method and its application in field-programmable gate array. - Yaning Wang; Shiwei Feng 001; Xianliang Lv; Kun Bai; Shijie Pan; Zixuan Feng; Xiaozhuang Lu; Yinqi Zhou; Boyang Zhang (Microelectron. J., 2025)

Micro-structure damage analysis of GaN HEMTs based on voltage transient trap characterization. - Qian Wen; Chunsheng Guo; Yingchen Du; Xianwei Meng; Shiwei Feng 001; Yamin Zhang (Microelectron. J., 2025)

Trapping Behaviors in CNTFETs: Measurement and Analysis of Time Constant, Energy Level, and Trap Location Based on Transient Drain Current. - Shijie Pan; Hui Zhu; Shiwei Feng 001; Yang Yang; Chao Xu; Shuai Huo; Xiaozhuang Lu; Yamin Zhang; Kun Bai (IEEE Trans. Instrum. Meas., 2025)