Acceleration of FDTD Method Using a Novel Algorithm on the Cell B.E. - Sho Endo; Jun Sonoda; Motoyuki Sato; Takafumi Aoki (IEICE Trans. Inf. Syst., 2011)

An on-chip glitchy-clock generator for testing fault injection attacks. - Sho Endo; Takeshi Sugawara 001; Naofumi Homma; Takafumi Aoki; Akashi Satoh (J. Cryptogr. Eng., 2011)

An Efficient Countermeasure against Fault Sensitivity Analysis Using Configurable Delay Blocks. - Sho Endo; Yang Li 001; Naofumi Homma; Kazuo Sakiyama; Kazuo Ohta; Takafumi Aoki (FDTC, 2012)

A Configurable On-Chip Glitchy-Clock Generator for Fault Injection Experiments. - Sho Endo; Takeshi Sugawara 001; Naofumi Homma; Takafumi Aoki; Akashi Satoh (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2012)

Exploring the Relations between Fault Sensitivity and Power Consumption. - Yang Li 001; Sho Endo; Nicolas Debande; Naofumi Homma; Takafumi Aoki; Thanh-Ha Le; Jean-Luc Danger; Kazuo Ohta; Kazuo Sakiyama (COSADE, 2013)

A Multiple-Fault Injection Attack by Adaptive Timing Control Under Black-Box Conditions and a Countermeasure. - Sho Endo; Naofumi Homma; Yu-ichi Hayashi; Junko Takahashi; Hitoshi Fuji; Takafumi Aoki (COSADE, 2014)

An Adaptive Multiple-Fault Injection Attack on Microcontrollers and a Countermeasure. - Sho Endo; Naofumi Homma; Yu-ichi Hayashi; Junko Takahashi; Hitoshi Fuji; Takafumi Aoki (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2015)

Electromagnetic Analysis against Public-Key Cryptographic Software on Embedded OS. - Hajime Uno; Sho Endo; Naofumi Homma; Yu-ichi Hayashi; Takafumi Aoki (IEICE Trans. Commun., 2015)

A Silicon-Level Countermeasure Against Fault Sensitivity Analysis and Its Evaluation. - Sho Endo; Yang Li 001; Naofumi Homma; Kazuo Sakiyama; Kazuo Ohta; Daisuke Fujimoto; Makoto Nagata; Toshihiro Katashita; Jean-Luc Danger; Takafumi Aoki (IEEE Trans. Very Large Scale Integr. Syst., 2015)