Low-capture-power test generation for scan-based at-speed testing. - Xiaoqing Wen; Yoshiyuki Yamashita; Shohei Morishima; Seiji Kajihara; Laung-Terng Wang; Kewal K. Saluja; Kozo Kinoshita (ITC, 2005)

A Framework of High-quality Transition Fault ATPG for Scan Circuits. - Seiji Kajihara; Shohei Morishima; Akane Takuma; Xiaoqing Wen; Toshiyuki Maeda; Shuji Hamada; Yasuo Sato (ITC, 2006)

Estimation of Delay Test Quality and Its Application to Test Generation. - Seiji Kajihara; Shohei Morishima; Masahiro Yamamoto; Xiaoqing Wen; Masayasu Fukunaga; Kazumi Hatayama; Takashi Aikyo (IPSJ Trans. Syst. LSI Des. Methodol., 2008)