New Capabilities of OBIRCH Method for Fault Localization and Defect Detection. - Kiyoshi Nikawa; Shoji Inoue (Asian Test Symposium, 1997)

Failure Analysis Case Studies Using the IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) Method. - Kiyoshi Nikawa; Shoji Inoue; Kazuyuki Morimoto; Shinya Sone (Asian Test Symposium, 1999)

New Approach of Laser-SQUID Microscopy to LSI Failure Analysis. - Kiyoshi Nikawa; Shoji Inoue; Tatsuoki Nagaishi; Toru Matsumoto 002; Katsuyoshi Miura; Koji Nakamae (IEICE Trans. Electron., 2009)