Frequency Dependency of Soft Error Rates Based on Dynamic Soft Error Measurements. - Haruto Sugisaki; Ryuichi Nakajima; Shotaro Sugitani; Jun Furuta; Kazutoshi Kobayashi (ICICDT, 2023)

SEU Sensitivity of PMOS and NMOS Transistors in a 65 nm Bulk Process by α-Particle Irradiation. - Keita Yoshida; Ryuichi Nakajima; Shotaro Sugitani; Takafumi Ito; Jun Furuta; Kazutoshi Kobayashi (ICICDT, 2023)

Radiation Hardness Evaluations of a Stacked Flip Flop in a 22 nm FD-SOI Process by Heavy-Ion Irradiation. - Shotaro Sugitani; Ryuichi Nakajima; Takafumi Ito; Jun Furuta; Kazutoshi Kobayashi; Mathieu Louvat; Francois Jacquet; Jean-Christophe Eloy; Olivier Montfort; Lionel Jure; Vincent Huard (IOLTS, 2023)

Radiation Hardened Flip-Flops with low Area, Delay and Power Overheads in a 65 nm bulk process. - Shotaro Sugitani; Ryuichi Nakajima; Keita Yoshida; Jun Furuta; Kazutoshi Kobayashi (IRPS, 2023)

A Partially-redundant Flip-flip Suitable for Mitigating Single Event Upsets in a FD-SOI Process with Low Performance Overhead. - Jun Furuta; Shotaro Sugitani; Ryuichi Nakajima; Kazutoshi Kobayashi (IRPS, 2024)

An Approach to Neutron-Induced SER Evaluation Using a Clinical 290 MeV/ u Carbon Beam and Particle Transport Simulations. - Ryuichi Nakajima; Shotaro Sugitani; Haruto Sugisaki; Takafumi Ito; Jun Furuta; Kazutoshi Kobayashi; Makoto Sakai (IRPS, 2024)

Frequency dependence of soft error rates induced by alpha-particle and heavy ion. - Haruto Sugisaki; Ryuichi Nakajima; Shotaro Sugitani; Jun Furuta; Kazutoshi Kobayashi (IEICE Electron. Express, 2024)

Measuring SET Pulse Widths in pMOSFETs and nMOSFETs Separately by Heavy Ion and Neutron Irradiation. - Jun Furuta; Shotaro Sugitani; Ryuichi Nakajima; Takafumi Ito; Kazutoshi Kobayashi (IEICE Trans. Electron., 2024)

Soft-Error Tolerance by Guard-Gate Structures on Flip-Flops in 22 and 65 nm FD-SOI Technologies. - Ryuichi Nakajima; Takafumi Ito; Shotaro Sugitani; Tomoya Kii; Mitsunori Ebara; Jun Furuta; Kazutoshi Kobayashi; Mathieu Louvat; Francois Jacquet; Jean-Christophe Eloy; Olivier Montfort; Lionel Jure; et al. (IEICE Trans. Electron., 2024)

Radiation-Hardened Flip-Flops in a 65 nm Bulk Process for Terrestrial Applications Coping with Radiation Hardness and Performance Overheads. - Shotaro Sugitani; Ryuichi Nakajima; Keita Yoshida; Jun Furuta; Kazutoshi Kobayashi (IEICE Trans. Electron., 2025)