Reduction of diagnostic fail data volume and tester time using a dynamic N-cover algorithm. - Shraddha Bodhe; M. Enamul Amyeen; Clariza Galendez; Houston Mooers; Irith Pomeranz; Srikanth Venkataraman (VTS, 2016)

Diagnostic Fail Data Minimization Using an N-Cover Algorithm. - Shraddha Bodhe; M. Enamul Amyeen; Irith Pomeranz; Srikanth Venkataraman (IEEE Trans. Very Large Scale Integr. Syst., 2016)

Test reordering for improved scan chain diagnosis using an enhanced defect diagnosis procedure. - Srikanth Venkataraman; Irith Pomeranz; Shraddha Bodhe; M. Enamul Amyeen (ITC, 2017)

Reordering Tests for Efficient Fail Data Collection and Tester Time Reduction. - Shraddha Bodhe; Irith Pomeranz; M. Enamul Amyeen; Srikanth Venkataraman (IEEE Trans. Very Large Scale Integr. Syst., 2017)

Algorithms for Efficient Fail Data Collection for Defect Diagnosis - Shraddha Bodhe (2017)

Global Control Signal Defect Diagnosis in Volume Production Environment. - Szczepan Urban; Piotr Zimnowlodzki; Manish Sharma; Shraddha Bodhe; John Schulze; Abdullah Yassine; Adam Styblinski (ITC, 2023)