Effect of flicker noise on SEIR for accurate ADC linearity testing. - Yuming Zhuang; Tao Chen 006; Shravan K. Chaganti; Degang Chen 001 (MWSCAS, 2015)

Toward complete analog fault coverage with minimal observation points using a fault propagation graph. - Zhiqiang Liu; Shravan K. Chaganti; Degang Chen 001 (ISCAS, 2016)

Accurate linearity testing with impure sinusoidal stimulus robust against flicker noise. - Yuming Zhuang; Tao Chen 006; Shravan K. Chaganti; Degang Chen 001 (VTS, 2016)

A digital clock-less pulse stretcher with application in deep sub-nanosecond pulse detection. - Zhiqiang Liu; Nanqi Liu; Shravan K. Chaganti; Degang Chen 001; Amitava Majumdar 002 (ISCAS, 2017)

A low-cost method for separation and accurate estimation of ADC noise, aperture jitter, and clock jitter. - Shravan K. Chaganti; Li Xu; Degang Chen 001 (VTS, 2017)

Low-cost and accurate DAC linearity test with ultrafast segmented model identification of linearity errors and removal of measurement errors (uSMILE-ROME). - Shravan K. Chaganti; Tao Chen 006; Yuming Zhuang; Degang Chen 001 (I2MTC, 2018)

A low-cost jitter separation and ADC spectral testing method without requiring coherent sampling. - Shravan K. Chaganti; Li Xu; Degang Chen 001 (ISCAS, 2018)

Concurrent Sampling with Local Digitization - An Alternative to Analog Test Bus. - Nanqi Liu; Shravan K. Chaganti; Zhiqiang Liu; Degang Chen 001; Amitava Majumdar 002 (ISCAS, 2018)

Fast and accurate linearity test for DACs with various architectures using segmented models. - Shravan K. Chaganti; Abalhassan Sheikh; Sumit Dubey; Frank Ankapong; Nitin Agarwal; Degang Chen 001 (ITC, 2018)

Improving Time-Efficiency of Fault-Coverage Simulation for MOS Analog Circuit. - Zhiqiang Liu; Shravan K. Chaganti; Degang Chen 001 (IEEE Trans. Circuits Syst. I Regul. Pap., 2018)

Quantile - Quantile Fitting Approach to Detect Site to Site Variations in Massive Multi-site Testing. - Praise O. Farayola; Shravan K. Chaganti; Abdullah O. Obaidi; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (VTS, 2020)

An Ultrafast Multibit/Stage Pipelined ADC Testing and Calibration Method. - Tao Chen 006; Chulhyun Park; Shravan K. Chaganti; José Silva-Martínez; Randall L. Geiger; Degang Chen 001 (IEEE Trans. Instrum. Meas., 2020)

Massive Multisite Variability-Aware Die Distribution Estimation for Analog/Mixed-Signal Circuits Test Validation. - Praise O. Farayola; Isaac Bruce; Shravan K. Chaganti; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (DTIS, 2021)

An Ordinal Optimization-Based Approach To Die Distribution Estimation For Massive Multi-site Testing Validation: A Case Study. - Isaac Bruce; Praise O. Farayola; Shravan K. Chaganti; Abdullah O. Obaidi; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (ETS, 2021)

Systematic Hardware Error Identification and Calibration for Massive Multisite Testing. - Praise O. Farayola; Isaac Bruce; Shravan K. Chaganti; Abdullah O. Obaidi; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (ITC, 2021)

Detection of Site to Site Variations From Volume Measurement Data in Multisite Semiconductor Testing. - Praise O. Farayola; Shravan K. Chaganti; Abdullah O. Obaidi; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (IEEE Trans. Instrum. Meas., 2021)

Cross-Correlation Approach to Detecting Issue Test Sites in Massive Parallel Testing. - Praise O. Farayola; Isaac Bruce; Shravan K. Chaganti; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (DFT, 2022)

Graph Theory Approach for Multi-site ATE Board Parameter Extraction. - Abraham Steenhoek; Praise O. Farayola; Isaac Bruce; Shravan K. Chaganti; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (ETS, 2022)

Low Cost High Accuracy Stimulus Generator for On-chip Spectral Testing. - Kushagra Bhatheja; Shravan K. Chaganti; Degang Chen 001; Xiankun Robert Jin; Chris C. Dao; Juxiang Ren; Abhishek Kumar; Daniel Correa; Mark Lehmann; Thomas Rodriguez; Eric Kingham; Joel R. Knight; et al. (ITC, 2022)

Optimal Order Polynomial Transformation for Calibrating Systematic Errors in Multisite Testing. - Praise O. Farayola; Isaac Bruce; Shravan K. Chaganti; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (ITC, 2022)

The Least-Squares Approach to Systematic Error Identification and Calibration in Semiconductor Multisite Testing. - Praise O. Farayola; Isaac Bruce; Shravan K. Chaganti; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (VTS, 2022)

A Polynomial Transform Method for Hardware Systematic Error Identification and Correction in Semiconductor Multi-Site Testing. - Praise O. Farayola; Isaac Bruce; Shravan K. Chaganti; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (J. Electron. Test., 2022)

An Improved Single-Temperature Trim Technique for 1st Order-Compensated Bandgap References. - Daniel Adjei; Bryce Gadogbe; Degang Chen 001; Randall L. Geiger; Shravan K. Chaganti; Dhyey Desai; Jerry Doorenbos; Jim Todsen (MWSCAS, 2023)

A Weighted-Bin Difference Method for Issue Site Identification in Analog and Mixed-Signal Multi-Site Testing. - Isaac Bruce; Praise O. Farayola; Shravan K. Chaganti; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (J. Electron. Test., 2023)

Site-to-Site Variation in Analog Multisite Testing: A Survey on Its Detection and Correction. - Praise O. Farayola; Ekaniyere Oko-Odion; Shravan K. Chaganti; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (IEEE Des. Test, 2023)

A BIST Approach to Approximate Co-Testing of Embedded Data Converters. - Kushagra Bhatheja; Shravan K. Chaganti; Johnathan Leisinger; Emmanuel Nti Darko; Isaac Bruce; Degang Chen 001 (IEEE Des. Test, 2024)