SAT-ATPG Generated Multi-Pattern Scan Tests for Cell Internal Defects: Coverage Analysis for Resistive Opens and Shorts. - Sujay Pandey; Zhiwei Liao; Shreyas Nandi; Sanya Gupta; Suriyaprakash Natarajan; Arani Sinha; Adit D. Singh; Abhijit Chatterjee (ITC, 2020)

Two Pattern Timing Tests Capturing Defect-Induced Multi-Gate Delay Impact of Shorts. - Sujay Pandey; Zhiwei Liao; Shreyas Nandi; Suriyaprakash Natarajan; Arani Sinha; Adit D. Singh; Abhijit Chatterjee (VTS, 2021)