Optimal multi-thresholding using a hybrid optimization approach. - Erwie Zahara; Shu-Kai S. Fan; Du-Ming Tsai (Pattern Recognit. Lett., 2005)

A genetic algorithm and a particle swarm optimizer hybridized with Nelder-Mead simplex search. - Shu-Kai S. Fan; Yun-Chia Liang; Erwie Zahara (Comput. Ind. Eng., 2006)

A Modified Particle Swarm Optimizer Using an Adaptive Dynamic Weight Scheme. - Shu-Kai S. Fan; Ju-Ming Chang (HCI (12), 2007)

Multiple-input dual-output adjustment scheme for semiconductor manufacturing processes using a dynamic dual-response approach. - Shu-Kai S. Fan; Yen Lin (Eur. J. Oper. Res., 2007)

A hybrid simplex search and particle swarm optimization for unconstrained optimization. - Shu-Kai S. Fan; Erwie Zahara (Eur. J. Oper. Res., 2007)

A multi-level thresholding approach using a hybrid optimal estimation algorithm. - Shu-Kai S. Fan; Yen Lin (Pattern Recognit. Lett., 2007)

Image thresholding using a novel estimation method in generalized Gaussian distribution mixture modeling. - Shu-Kai S. Fan; Yen Lin; Chia-Chan Wu (Neurocomputing, 2008)

A fast estimation method for the generalized Gaussian mixture distribution on complex images. - Shu-Kai S. Fan; Yen Lin (Comput. Vis. Image Underst., 2009)

A New Image Registration Method Using Intensity Difference Data on Overlapped Image. - Shu-Kai S. Fan; Yu-Chiang Chuang (UIC/ATC Workshops, 2010)

Automatic detection of Mura defect in TFT-LCD based on regression diagnostics. - Shu-Kai S. Fan; Yu-Chiang Chuang (Pattern Recognit. Lett., 2010)

An entropy-based image registration method using image intensity difference on overlapped region. - Shu-Kai S. Fan; Yu-Chiang Chuang (Mach. Vis. Appl., 2012)

An Entropy-based Method for Color Image Registration. - Shu-Kai S. Fan; Yu-Chiang Chuang (VISAPP (1), 2013)

Nonlinear Profile Monitoring of Reflow Process Data Based on the Sum of Sine Functions. - Shu-Kai S. Fan; Yuan-Jung Chang; Nafy Aidara (Qual. Reliab. Eng. Int., 2013)

Robust Multivariate Control Chart for Outlier Detection Using Hierarchical Cluster Tree in SW2. - Shu-Kai S. Fan; Hui-Kuo Huang; Yuan-Jung Chang (Qual. Reliab. Eng. Int., 2013)

Applying HBMO-based SOM in Predicting the Taiwan Steel Price Fluctuation. - Chui-Yu Chiu; Shu-Kai S. Fan; Po-Chou Shih; Yi-Hsin Weng (Int. J. Electron. Bus. Manag., 2014)

Using machine learning and big data approaches to predict travel time based on historical and real-time data from Taiwan electronic toll collection. - Shu-Kai S. Fan; Chuan-Jun Su; Han-Tang Nien; Pei-Fang Tsai; Chen-Yang Cheng (Soft Comput., 2018)

Defective wafer detection using a denoising autoencoder for semiconductor manufacturing processes. - Shu-Kai S. Fan; Chia-Yu Hsu; Chih-Hung Jen; Kuan-Lung Chen; Li-Ting Juan (Adv. Eng. Informatics, 2020)

Corrigendum to "Defective wafer detection using a denoising autoencoder for semiconductor manufacturing processes" [Adv. Eng. Informat. 46 (2020) 101166]. - Shu-Kai S. Fan; Chia-Yu Hsu; Chih-Hung Jen; Kuan-Lung Chen; Li-Ting Juan (Adv. Eng. Informatics, 2020)

Data-Driven Approach for Fault Detection and Diagnostic in Semiconductor Manufacturing. - Shu-Kai S. Fan; Chia-Yu Hsu; Du-Ming Tsai; Fei He; Chun-Chung Cheng (IEEE Trans Autom. Sci. Eng., 2020)

A New Double Exponentially Weighted Moving Average Run-to-Run Control Using a Disturbance-Accumulating Strategy for Mixed-Product Mode. - Shu-Kai S. Fan; Chih-Hung Jen; Chia-Yu Hsu; Yu-Ling Liao (IEEE Trans Autom. Sci. Eng., 2021)

Auto-Annotated Deep Segmentation for Surface Defect Detection. - Du-Ming Tsai; Shu-Kai S. Fan; Yi-Hsiang Chou (IEEE Trans. Instrum. Meas., 2021)

Product-to-Product Virtual Metrology of Color Filter Processes in Panel Industry. - Shu-Kai S. Fan; Xiao-Wen Chang; Yu-Yu Lin (IEEE Trans Autom. Sci. Eng., 2022)

Fault Diagnosis of Wafer Acceptance Test and Chip Probing Between Front-End-of-Line and Back-End-of-Line Processes. - Shu-Kai S. Fan; Chun-Wei Cheng; Du-Ming Tsai (IEEE Trans Autom. Sci. Eng., 2022)

Key Feature Identification for Monitoring Wafer-to-Wafer Variation in Semiconductor Manufacturing. - Shu-Kai S. Fan; Chia-Yu Hsu; Du-Ming Tsai; Mabel C. Chou; Chih-Hung Jen; Jen-Hsuan Tsou (IEEE Trans Autom. Sci. Eng., 2022)

Data-Driven Virtual Metrology and Retraining Systems for Color Filter Processes of TFT-LCD Manufacturing. - Chih-Hung Jen; Shu-Kai S. Fan; Yu-Yu Lin (IEEE Trans. Instrum. Meas., 2022)

Using the Concept of Generative Adversarial Network (GAN) to Strengthen the Classification Performance for X-ray Images of Small Samples. - Chih-Hung Jen; Shu-Kai S. Fan; Kun-Mu Lu; Ching-Wen Huang; Ju-Ling Hsiao; Yu-Zhi Zheng; Yi-Jun Cai (ICMHI, 2023)

Sustainable multi-biofuel production with stochastic lead time and optimum energy utilization under flexible manufacturing. - Biswajit Sarkar; Shu-Kai S. Fan; Sarla Pareek; Bablu Mridha (Comput. Ind. Eng., 2024)

A generative-adversarial-network-based temporal raw trace data augmentation framework for fault detection in semiconductor manufacturing. - Shu-Kai S. Fan; Wei-Yu Chen (Eng. Appl. Artif. Intell., 2025)

A Novel Rolling-Window and Production-Maintenance-Based Machine Learning Approach to Virtual Metrology in Semiconductor Manufacturing. - Shu-Kai S. Fan; An-Ting Zheng (IEEE Trans Autom. Sci. Eng., 2025)