Empirical-Statistics Analysis for Zero-Failure GaAs MMICs Life Testing Data. - Zheng-Liang Huang; Fa-Xin Yu; Shu-Ting Zhang; Hao Luo 001; Ping-Hui Wang; Yao Zheng (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2009)