DefectGAN: Weakly-Supervised Defect Detection using Generative Adversarial Network. - Shuanlong Niu; Hui Lin; Tongzhi Niu; Bin Li 026; Xinggang Wang (CASE, 2019)

Uneven Illumination Surface Defects Inspection Based on Saliency Detection and Intrinsic Image Decomposition. - Yuanhong Qiu; Lixin Tang; Bin Li 026; Suanlong Niu; Tongzhi Niu (IEEE Access, 2020)

Defect Image Sample Generation With GAN for Improving Defect Recognition. - Shuanlong Niu; Bin Li 026; Xinggang Wang; Hui Lin (IEEE Trans Autom. Sci. Eng., 2020)

Defect attention template generation cycleGAN for weakly supervised surface defect segmentation. - Shuanlong Niu; Bin Li 026; Xinggang Wang; Songping He; Yaru Peng (Pattern Recognit., 2022)

Joint-Prior-Based Uneven Illumination Image Enhancement for Surface Defect Detection. - Yuanhong Qiu; Shuanlong Niu; Tongzhi Niu; Weifeng Li; Bin Li 026 (Symmetry, 2022)

Region- and Strength-Controllable GAN for Defect Generation and Segmentation in Industrial Images. - Shuanlong Niu; Bin Li 026; Xinggang Wang; Yaru Peng (IEEE Trans. Ind. Informatics, 2022)

NAS-ASDet: An Adaptive Design Method for Surface Defect Detection Network using Neural Architecture Search. - Zhenrong Wang; Bin Li 026; Weifeng Li; Shuanlong Niu; Wang Miao; Tongzhi Niu (CoRR, 2023)

Selecting informative data for defect segmentation from imbalanced datasets via active learning. - Weifeng Li; Bin Li 026; Shuanlong Niu; Zhenrong Wang; Baohui Liu; Tongzhi Niu (Adv. Eng. Informatics, 2023)

A transformed-feature-space data augmentation method for defect segmentation. - Shuanlong Niu; Yaru Peng; Bin Li 026; Xinggang Wang (Comput. Ind., 2023)

NAS-ASDet: An adaptive design method for surface defect detection network using neural architecture search. - Zhenrong Wang; Bin Li 026; Weifeng Li; Shuanlong Niu; Miao Wang; Tongzhi Niu (Adv. Eng. Informatics, 2024)

A drift detection method for industrial images based on a defect segmentation model. - Weifeng Li; Bin Li 026; Zhenrong Wang; Chaochao Qiu; Shuanlong Niu; Xin Tan; Tongzhi Niu (Knowl. Based Syst., 2024)

A novel deep learning motivated data augmentation system based on defect segmentation requirements. - Shuanlong Niu; Yaru Peng; Bin Li 026; Yuanhong Qiu; Tongzhi Niu; Weifeng Li (J. Intell. Manuf., 2024)