VAD: A Detail Investigation into Process's Memory. - Xudong Li; Chunxia Zhang; Xing Lin; Shuguang Lin (CIS (1), 2009)

A Statistical Model to Detect DRG Outliers. - Shuguang Lin; Paul Rouse; Ying-Ming Wang 001; Fan Zhang (IEEE Access, 2022)

Five DRGs. - Shuguang Lin; Ying-Ming Wang 001; Fan Zhang (IEEE DataPort, 2022)