Effective Post-BIST Fault Diagnosis for Multiple Faults. - Hiroshi Takahashi; Shuhei Kadoyama; Yoshinobu Higami; Yuzo Takamatsu; Koji Yamazaki; Takashi Aikyo; Yasuo Sato (DFT, 2006)

Clues for Modeling and Diagnosing Open Faults with Considering Adjacent Lines. - Hiroshi Takahashi; Yoshinobu Higami; Shuhei Kadoyama; Takashi Aikyo; Yuzo Takamatsu; Koji Yamazaki; Toshiyuki Tsutsumi; Hiroyuki Yotsuyanagi; Masaki Hashizume (ATS, 2007)

Post-BIST Fault Diagnosis for Multiple Faults. - Hiroshi Takahashi; Yoshinobu Higami; Shuhei Kadoyama; Yuzo Takamatsu; Koji Yamazaki; Takashi Aikyo; Yasuo Sato (IEICE Trans. Inf. Syst., 2008)