Hot carrier effect on the bipolar transistors' response to electromagnetic interference. - Cen Xiong; Shuhuan Liu; Yonghong Li; Du Tang; Jinxin Zhang; Xuecheng Du; Chaohui He (Microelectron. Reliab., 2015)

Hot carrier effect on a single SiGe HBT's EMI response. - Cen Xiong; Yonghong Li; Shuhuan Liu; Du Tang; Jinxin Zhang; Chaohui He (Microelectron. Reliab., 2015)

Single event effects sensitivity of low energy proton in Xilinx Zynq-7010 system-on chip. - Xuecheng Du; Shuhuan Liu; Dongyang Luo; Yao Zhang; Xiaozhi Du; Chaohui He; Xiaotang Ren; Weitao Yang; Yuan Yuan (Microelectron. Reliab., 2017)

A Fine-Grained Software-Implemented DMA Fault Tolerance for SoC Against Soft Error. - Xiaozhi Du; Dongyang Luo; Chaohui He; Shuhuan Liu (J. Electron. Test., 2018)

FFI4SoC: a Fine-Grained Fault Injection Framework for Assessing Reliability against Soft Error in SoC. - Xiaozhi Du; Dongyang Luo; Kailun Shi; Chaohui He; Shuhuan Liu (J. Electron. Test., 2018)

60Co gamma radiation total ionizing dose combined with conducted electromagnetic interference studies in BJTs. - Olarewaju Mubashiru Lawal; Shuhuan Liu; Zhuoqi Li; Aqil Hussain (Microelectron. Reliab., 2018)

Experimental Investigation of the Effects of Reactor Neutron-Gamma Pulse Irradiation on SiGe HBTs Under Different Bias Conditions. - Zhuoqi Li; Shuhuan Liu; Ci Song; Ning Han; Mathew Adefusika Adekoya (IEEE Access, 2021)

Homogeneous Cohort-Aware Group Cognitive Diagnosis: A Multi-grained Modeling Perspective. - Shuhuan Liu; Xiaoshan Yu 002; Haiping Ma; Ziwen Wang 006; Chuan Qin 002; Xingyi Zhang 001 (CIKM, 2023)