Interconnect and Delay Testing with a 4800-Pin Board Tester. - Shuichi Kameyama; Hideyuki Ohara; Chihiro Endo; Naoki Takayama (ITC, 1992)

Test Pattern Selection for Defect-Aware Test. - Yoshinobu Higami; Hiroshi Furutani; Takao Sakai; Shuichi Kameyama; Hiroshi Takahashi (Asian Test Symposium, 2011)

Surviving state disruptions caused by test: A case study. - Kenneth P. Parker; Shuichi Kameyama; David Dubberke (ITC, 2011)

Travel Time Estimation for Ambulances based on a Smartphone and Car-mounted Camera Survey. - Shohei Nunohiro; Takumi Asada; Shuichi Kameyama (GCCE, 2021)

High-speed FPGA-based Design and Implementation of Text Search Processor. - Binh Kieu-Do-Nguyen; Tuan-Kiet Dang; Trong-Thuc Hoang; Katsumi Inoue; Toshinori Usugi; Masanori Odaka; Shuichi Kameyama; Cong-Kha Pham (ICICDT, 2022)