PATEGE: an automatic DC parametric test generation system for series gated ECL circuits. - Takuji Ogihara; Shuichi Saruyama; Shinichi Murai (DAC, 1985)

Test generation for sequential circuits using individual initial value propagation. - Takuji Ogihara; Shuichi Saruyama; Shinichi Murai (ICCAD, 1988)