Method of diagnosing multiple stuck-at-faults in combinational circuits. - Teruhiko Yamada; Shuji Hamada; Tatsuo Matsumoto; Toshihiko Takahashi; Takao Nakayama (Syst. Comput. Jpn., 1991)

Evaluation of the statistical delay quality model. - Yasuo Sato; Shuji Hamada; Toshiyuki Maeda; Atsuo Takatori; Seiji Kajihara (ASP-DAC, 2005)

Path delay test compaction with process variation tolerance. - Seiji Kajihara; Masayasu Fukunaga; Xiaoqing Wen; Toshiyuki Maeda; Shuji Hamada; Yasuo Sato (DAC, 2005)

Invisible delay quality - SDQM model lights up what could not be seen. - Yasuo Sato; Shuji Hamada; Toshiyuki Maeda; Atsuo Takatori; Yasuyuki Nozuyama; Seiji Kajihara (ITC, 2005)

A dynamic test compaction procedure for high-quality path delay testing. - Masayasu Fukunaga; Seiji Kajihara; Xiaoqing Wen; Toshiyuki Maeda; Shuji Hamada; Yasuo Sato (ASP-DAC, 2006)

Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects. - Xijiang Lin; Kun-Han Tsai; Chen Wang 014; Mark Kassab; Janusz Rajski; Takeo Kobayashi; Randy Klingenberg; Yasuo Sato; Shuji Hamada; Takashi Aikyo (ATS, 2006)

Not all Delay Tests Are the Same - SDQL Model Shows True-Time. - Anis Uzzaman; Mick Tegethoff; Bibo Li; Kevin McCauley; Shuji Hamada; Yasuo Sato (ATS, 2006)

Recognition of Sensitized Longest Paths in Transition Delay Test. - Shuji Hamada; Toshiyuki Maeda; Atsuo Takatori; Yasuyuki Noduyama; Yasuo Sato (ITC, 2006)

A Framework of High-quality Transition Fault ATPG for Scan Circuits. - Seiji Kajihara; Shohei Morishima; Akane Takuma; Xiaoqing Wen; Toshiyuki Maeda; Shuji Hamada; Yasuo Sato (ITC, 2006)

A Statistical Quality Model for Delay Testing. - Yasuo Sato; Shuji Hamada; Toshiyuki Maeda; Atsuo Takatori; Seiji Kajihara (IEICE Trans. Electron., 2006)