Research on IGBT Bonding Wires Crack Propagation at the Macro and Micro Scales. - Jun Luo; Shukai Guan; Bo Wan; Maogong Jiang; Guicui Fu (IEEE Access, 2021)

Research on the On-orbit Reliability Prediction Method of SiC MOSFET. - Yang Yang; Shukai Guan; Shimin Hong; Bo Wan; Guicui Fu (ISSSR, 2024)

A Novel Propagation Model of Single Event Effect Soft Error in FPGA Based on Cellular Automata. - Yanbo Yang; Bo Wan; Zhiqiang Chen; Shukai Guan; Guicui Fu (ISSSR, 2024)