Exploring linear structures of critical path delay faults to reduce test efforts. - Shun-Yen Lu; Pei-Ying Hsieh; Jing-Jia Liou (ICCAD, 2006)

An efficient SAT-based path delay fault ATPG with an unified sensitization model. - Shun-Yen Lu; Ming-Ting Hsieh; Jing-Jia Liou (ITC, 2007)

High Quality Pattern Generation for Delay Defects with Functional Sensitized Paths. - Ming-Ting Hsieh; Shun-Yen Lu; Jing-Jia Liou; Augusli Kifli (ATS, 2008)