Automated visual inspection for lsi water multilayer patterns by cascade pattern matching algorithm. - Shunji Maeda; Hitoshi Kubota; Hiroshi Makihira; Takanori Ninomiya; Yasuo Nakagawa; Yuzo Taniguchi (Syst. Comput. Jpn., 1990)

Precise visual inspection for LSI wafer patterns using subpixel image alignment. - Takashi Hiroi; Shunji Maeda; Hitoshi Kubota; Kenji Watanabe; Yasuo Nakagawa (WACV, 1994)

Optimum threshold generation for automated visual inspection of large-scale integration wafer patterns. - Shunji Maeda; Hitoshi Kubota; Hiroshi Makihira (Syst. Comput. Jpn., 1996)

Threshold setting assisted by numerical analysis methods in automatic visual inspection using gray-scale image comparison. - Shunji Maeda; Fumiaki Endo; Hiroshi Makihira; Hitoshi Kubota (Syst. Comput. Jpn., 1998)

Precise detection of short-circuit defects on TFT substrate by infrared image matching. - Shunji Maeda; Makoto Ono; Hitoshi Kubota; Mitsuo Nakatani (Syst. Comput. Jpn., 1999)

Unified evaluation method of white uniformity for electronic displays. - Toshio Asano; Takahiro Kondoh; Shunji Maeda (IECON, 2013)

320 × 240 Back-Illuminated 10-µm CAPD Pixels for High-Speed Modulation Time-of-Flight CMOS Image Sensor. - Yuichi Kato; Takuya Sano; Yusuke Moriyama; Shunji Maeda; Takeshi Yamazaki; Atsushi Nose; Kimiyasu Shiina; Yohtaro Yasu; Ward van der Tempel; Alper Ercan; Yoshiki Ebiko; Daniel Van Nieuwenhove; et al. (IEEE J. Solid State Circuits, 2018)

Utilization of the Infrared Image Capturing Combustion State for Estimating the Steam Flow Aming to Stabilize Garbage Power Generation. - Takuya Anjiki; Kanta Matsubayashi; Shunji Maeda (ICMLC, 2019)

Analyzing Causal Relationships of Sensor Data and Infrared Images to Stabilize Garbage Power Generation. - Kanta Matsubayashi; Takuya Anjiki; Shunji Maeda (ICMLC, 2019)

A Basic Study on Railway Facility Extraction Using a Single-Shot Multi-Box Detector. - Masami Nakamura; Yuta Aoto; Shunji Maeda (ICMLC, 2019)