A Systematic Approach to Memory Test Time Reduction. - Jen-Chieh Yeh; Chao-Hsun Chen; Cheng-Wen Wu; Shuo-Fen Kuo (IEEE Des. Test Comput., 2008)

Case study of yield learning through in-house flow of volume diagnosis. - Pei-Ying Hsueh; Shuo-Fen Kuo; Chao-Wen Tzeng; Jih-Nung Lee; Chi-Feng Wu (VLSI-DAT, 2013)

Physical-aware systematic multiple defect diagnosis. - Po-Juei Chen; Chieh-Chih Che; J. C.-M. Li; Shuo-Fen Kuo; Pei-Ying Hsueh; Chun-Yi Kuo; Jih-Nung Lee (IET Comput. Digit. Tech., 2014)