Automatic test pattern generation for delay defects using timed characteristic functions. - Shin-Yann Ho; Shuo-Ren Lin; Ko-Lung Yuan; Chien-Yen Kuo; Kuan-Yu Liao; Jie-Hong R. Jiang; Chien-Mo James Li (ICCAD, 2013)

Software Workarounds for Hardware Errors: Instruction Patch Synthesis. - Tsung-Po Liu; Shuo-Ren Lin; Jie-Hong R. Jiang (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2013)

Flexibility and Optimization of QBF Skolem-Herbrand Certificates. - Valeriy Balabanov; Shuo-Ren Lin; Jie-Hong R. Jiang (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016)