Efficient parametric yield estimation of analog/mixed-signal circuits via Bayesian model fusion. - Xin Li 001; Wangyang Zhang; Fa Wang; Shupeng Sun; Chenjie Gu (ICCAD, 2012)

Efficient SRAM Failure Rate Prediction via Gibbs Sampling. - Shupeng Sun; Yamei Feng; Changdao Dong; Xin Li 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012)

Structure-aware high-dimensional performance modeling for analog and mixed-signal circuits. - Shupeng Sun; Xin Li 001; Chenjie Gu (CICC, 2013)

Indirect performance sensing for on-chip analog self-healing via Bayesian model fusion. - Shupeng Sun; Fa Wang; Soner Yaldiz; Xin Li 001; Lawrence T. Pileggi; Arun Natarajan 001; Mark A. Ferriss; Jean-Olivier Plouchart; Bodhisatwa Sadhu; Benjamin D. Parker; Alberto Valdes-Garcia; Mihai A. T. Sanduleanu; et al. (CICC, 2013)

Bayesian model fusion: large-scale performance modeling of analog and mixed-signal circuits by reusing early-stage data. - Fa Wang; Wangyang Zhang; Shupeng Sun; Xin Li 001; Chenjie Gu (DAC, 2013)

Bayesian model fusion: a statistical framework for efficient pre-silicon validation and post-silicon tuning of complex analog and mixed-signal circuits. - Xin Li 001; Fa Wang; Shupeng Sun; Chenjie Gu (ICCAD, 2013)

Fast statistical analysis of rare circuit failure events via scaled-sigma sampling for high-dimensional variation space. - Shupeng Sun; Xin Li 001; Hongzhou Liu; Kangsheng Luo; Ben Gu (ICCAD, 2013)

Fast statistical analysis of rare circuit failure events via subset simulation in high-dimensional variation space. - Shupeng Sun; Xin Li 001 (ICCAD, 2014)

Indirect Performance Sensing for On-Chip Self-Healing of Analog and RF Circuits. - Shupeng Sun; Fa Wang; Soner Yaldiz; Xin Li 001; Lawrence T. Pileggi; Arun Natarajan 001; Mark A. Ferriss; Jean-Olivier Plouchart; Bodhisatwa Sadhu; Benjamin D. Parker; Alberto Valdes-Garcia; Mihai A. T. Sanduleanu; et al. (IEEE Trans. Circuits Syst. I Regul. Pap., 2014)

Fast statistical analysis of rare failure events for memory circuits in high-dimensional variation space. - Shupeng Sun; Xin Li 001 (ASP-DAC, 2015)

Fast statistical analysis of rare circuit failure events via Bayesian scaled-sigma sampling for high-dimensional variation space. - Shupeng Sun; Xin Li 001 (CICC, 2015)

A statistical methodology for noise sensor placement and full-chip voltage map generation. - Xiaochen Liu; Shupeng Sun; Pingqiang Zhou; Xin Li 001; Haifeng Qian (DAC, 2015)

Bayesian Model Fusion: Large-Scale Performance Modeling of Analog and Mixed-Signal Circuits by Reusing Early-Stage Data. - Fa Wang; Paolo Cachecho; Wangyang Zhang; Shupeng Sun; Xin Li 001; Rouwaida Kanj; Chenjie Gu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016)

Machine Learning for Noise Sensor Placement and Full-Chip Voltage Emergency Detection. - Xiaochen Liu; Shupeng Sun; Xin Li 001; Haifeng Qian; Pingqiang Zhou (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2017)

Sparse Regression Driven Mixture Importance Sampling for Memory Design. - Maria Malik; Rajiv V. Joshi; Rouwaida Kanj; Shupeng Sun; Houman Homayoun; Tong Li (IEEE Trans. Very Large Scale Integr. Syst., 2018)

Nonlinear Dynamic Modeling and Model Reduction Strategy for Rotating Thin Cylindrical Shells. - Shupeng Sun; Lun Liu 004 (Complex., 2019)