Bubble detection in photoresist with small samples based on GAN augmentations and modified YOLO. - Guang Yang 045; Chunhe Song; Zhijia Yang; Shuping Cui (Eng. Appl. Artif. Intell., 2023)

Clustering Federated Learning for Wafer Defects Classification on Statistical Heterogeneous Data. - Guang Yang 045; Zhijia Yang; Shuping Cui; Chunhe Song; Jizhou Wang; Haodong Wei (IEEE Trans. Instrum. Meas., 2024)

Multibranched Dilated Convolution With Feature Fusion and Dropout for Accurate Wafer Surface Defect Detection. - Guang Yang 045; Zhijia Yang; Junzhang Pan; Yulin Miao; Shuping Cui (IEEE Trans. Instrum. Meas., 2025)