CMOS high-speed, high-precision timing generator for 4.266-Gbps memory test system. - Masakatsu Suda; Kazuhiro Yamamoto; Toshiyuki Okayasu; Shusuke Kantake; Satoshi Sudou; Daisuke Watanabe (ITC, 2005)

1.83ps-Resolution CMOS Dynamic Arbitrary Timing Generator for >4GHz ATE Applications. - Toshiyuki Okayasu; Masakatsu Suda; Kazuhiro Yamamoto; Shusuke Kantake; Satoshi Sudou; Daisuke Watanabe (ISSCC, 2006)