Comprehensive physics-based modeling of post-cycling long-term data retention in 176L 3-D NAND Flash Memories. - Karansingh Thakor; Nikhil Rangarajan; Himanshu Diwakar; Rashmi Saikia; Tarun Samadder; Souvik Mahapatra; Shyam Raghunathan; Yingda Dong (IMW, 2024)