Application of Real-time Contrast Enhancement Techniques on Scanning Electron Microscope (SEM) Images. - Cheng Zheng; Yik Yee Tan; Shyamala Pillay; Johthi P. Tambusamy; Kok-Swee Sim (VISION, 2005)

Line Profile Measurement for SEM Imaging System. - Kok Swee Sim; Chih Ping Tso; Yik Yee Tan; Shyamala Pillay (IPCV, 2006)