A testable static RAM structure for efficient coverage of pattern sensitive faults. - Shyang-Tai Su; Rafic Z. Makki (VTS, 1992)

Testing of static random access memories by monitoring dynamic power supply current. - Shyang-Tai Su; Rafic Z. Makki (J. Electron. Test., 1992)

Analysis and Characterization of State Assignment Techniques for Sequential Machines. - Rafic Z. Makki; Shyang-Tai Su (VLSI Design, 1994)

Transient Power Supply Current Testing of Digital CMOS Circuits. - Rafic Z. Makki; Shyang-Tai Su; H. Troy Nagle (ITC, 1995)

Transient power supply current monitoring - A new test method for CMOS VLSI circuits. - Shyang-Tai Su; Rafic Z. Makki; H. Troy Nagle (J. Electron. Test., 1995)