A Built-in Self-Test and Self-Diagnosis Scheme for Heterogeneous SRAM Clusters. - Chih-Wea Wang; Ruey-Shing Tzeng; Chi-Feng Wu; Chih-Tsun Huang; Cheng-Wen Wu; Shi-Yu Huang; Shyh-Horng Lin; Hsin-Po Wang 002 (Asian Test Symposium, 2001)

VirtualScan: A New Compressed Scan Technology for Test Cost Reduction. - Laung-Terng Wang; Khader S. Abdel-Hafez; Shianling Wu; Xiaoqing Wen; Hiroshi Furukawa; Fei-Sheng Hsu; Shyh-Horng Lin; Sen-Wei Tsai (ITC, 2004)

UltraScan: using time-division demultiplexing/multiplexing (TDDM/TDM) with VirtualScan for test cost reduction. - Laung-Terng Wang; Khader S. Abdel-Hafez; Xiaoqing Wen; Boryau Sheu; Shianling Wu; Shyh-Horng Lin; Ming-Tung Chang (ITC, 2005)