Using a two-layer competitive Hopfield neural network for semiconductor wafer defect detection. - Chuan-Yu Chang; Si-Yan Lin; MuDer Jeng (CASE, 2005)

Simulation Studies of Two-Layer Hopfield Neural Networks for Automatic Wafer Defect Inspection. - Chuan-Yu Chang; Hung-Jen Wang; Si-Yan Lin (IEA/AIE, 2006)

Application of Two Hopfield Neural Networks for Automatic Four-Element LED Inspection. - Chuan-Yu Chang; ChunHsi Li; Si-Yan Lin; MuDer Jeng (IEEE Trans. Syst. Man Cybern. Part C, 2009)