Device Aware Diagnosis for Unique Defects in STT-MRAMs. - Ahmed Aouichi; Sicong Yuan; Moritz Fieback; Siddharth Rao; Woojin Kim; Erik Jan Marinissen; Sebastien Couet; Mottaqiallah Taouil; Said Hamdioui (ATS, 2023)

Characterization and Test of Intermittent Over RESET in RRAMs. - Hanzhi Xun; Moritz Fieback; Sicong Yuan; Hassen Aziza; Mathijs Heidekamp; Thiago Copetti; Letícia Maria Veiras Bolzani Poehls; Mottaqiallah Taouil; Said Hamdioui (ATS, 2023)

Device-Aware Test for Back-Hopping Defects in STT-MRAMs. - Sicong Yuan; Mottaqiallah Taouil; Moritz Fieback; Hanzhi Xun; Erik Jan Marinissen; Gouri Sankar Kar; Sidharth Rao; Sebastien Couet; Said Hamdioui (DATE, 2023)

Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs. - Hanzhi Xun; Moritz Fieback; Sicong Yuan; Ziwei Zhang; Mottaqiallah Taouil; Said Hamdioui (ETS, 2023)

Device-Aware Test for Ion Depletion Defects in RRAMs. - Hanzhi Xun; Sicong Yuan; Moritz Fieback; Hassen Aziza; Mottaqiallah Taouil; Said Hamdioui (ITC, 2023)

Magnetic Coupling Based Test Development for Contact and Interconnect Defects in STT-MRAMs. - Sicong Yuan; Ziwei Zhang; Moritz Fieback; Hanzhi Xun; Erik Jan Marinissen; Gouri Sankar Kar; Sidharth Rao; Sebastien Couet; Mottaqiallah Taouil; Said Hamdioui (ITC, 2023)

Device-Aware Diagnosis for Yield Learning in RRAMs. - Hanzhi Xun; Moritz Fieback; Sicong Yuan; Hassen Aziza; Mottaqiallah Taouil; Said Hamdioui (DATE, 2024)

Online Detection of Unique Faults in RRAMs. - Hanzhi Xun; Moritz Fieback; Mohammad Amin Yaldagard; Sicong Yuan; Hassen Aziza; Mottaqiallah Taouil; Said Hamdioui (ETS, 2024)

Design-for-Test for Intermittent Faults in STT-MRAMs. - Sicong Yuan; Mohammad Amin Yaldagard; Hanzhi Xun; Moritz Fieback; Erik Jan Marinissen; Woojin Kim; Siddharth Rao; Sebastien Couet; Mottaqiallah Taouil; Said Hamdioui (ETS, 2024)

Defects, Fault Modeling, and Test Development Framework for FeFETs. - Changhao Wang; Sicong Yuan; Hanzhi Xun; Chaobo Li; Mottaqiallah Taouil; Moritz Fieback; Danyang Chen; Xiuyan Li; Lin Wang 111; Riccardo Cantoro; Chujun Yin; Said Hamdioui (ITC, 2024)

Robust Design-for-Testability Scheme for Conventional and Unique Defects in RRAMs. - Hanzhi Xun; Moritz Fieback; Mohammad Amin Yaldagard; Sicong Yuan; Erbing Hua; Hassen Aziza; Mottaqiallah Taouil; Said Hamdioui (ITC, 2024)

Testing STT-MRAMs: Do We Need Magnets in our Automated Test Equipment? - Sicong Yuan; Hanzhi Xun; Woojin Kim; Siddharth Rao; Erik Jan Marinissen; Sebastien Couet; Moritz Fieback; Mottaqiallah Taouil; Said Hamdioui (ITC, 2024)

Device-Aware Test for Anomalous Charge Trapping in FeFETs. - Sicong Yuan; Changhao Wang; Moritz Fieback; Hanzhi Xun; Mottaqiallah Taouil; Xiuyan Li; Danyang Chen; Lin Wang 111; Nicolò Bellarmino; Riccardo Cantoro; Said Hamdioui (ASP-DAC, 2025)

In-Field Monitoring and Preventing Read Disturb Faults in RRAMs. - Hanzhi Xun; Moritz Fieback; Sicong Yuan; Changhao Wang; Erbing Hua; Hassen Aziza; Leticia Bolzani Poehls; Riccardo Cantoro; Rajendra Bishnoi; Mottaqiallah Taouil; Said Hamdioui (ETS, 2025)