Avalanche and Short-Circuit Robustness of 4600 V SiC DMOSFETs. - Siddarth Sundaresan; Vamsi Mulpuri; Stoyan Jeliazkov; Ranbir Singh (IRPS, 2019)

Reliability and Robustness Performance of 1200 V SiC DMOSFETs. - Siddarth Sundaresan; Vamsi Mulpuri; Jaehoon Park; Ranbir Singh (IRPS, 2020)

Dynamic Reverse Bias Reliability Testing of SiC MOSFETs. - Vamsi Mulpuri; Vishank Talesara; Kailun Zhong; Siddarth Sundaresan; Navitas Semiconductor (IRPS, 2025)