Variation and failure characterization through pattern classification of test data from multiple test stages. - Chun-Kai Hsu; Peter Sarson; Gregor Schatzberger; Friedrich Peter Leisenberger; John M. Carulli Jr.; Siddhartha Siddhartha; Kwang-Ting Cheng (ITC, 2016)

Graph Representational Learning for Internal Audit. - Sumit Pai; Vivek Kumar Singh; Sanvi Gupta; Pavani Chavali; Siddhartha Siddhartha; Edward Bowen; Sunil R. Tiyyagura (ISWC (Posters/Demos/Industry), 2023)