Voltage Temperature Monitoring System (VTMS) for a BTS Room - Sadeque Reza Khan; Siddique Reza Khan; Arifa Ferdousi (CoRR, 2012)

Einsatz von Deep Learning für den Test Eingebetteter Systeme. - Jens Bielefeldt; Kai-Uwe Basener; Siddique Reza Khan; Mozhdeh Massah; Hans-Werner Wiesbrock; Stefan Scharoba; Michael Hübner 001 (GI-Jahrestagung, 2021)

DeepTest: How Machine Learning Can Improve the Test of Embedded Systems. - Jens Bielefeldt; Kai-Uwe Basener; Siddique Reza Khan; Mozhdeh Massah; Hans-Werner Wiesbrock; Stefan Scharoba; Michael Hübner 001 (MECO, 2021)