A Hard-Sphere Model to Simulate Alloy Thin Films. - Arthur S. Nowick; Siegfried R. Mader (IBM J. Res. Dev., 1965)

Stress-induced dislocations in silicon integrated circuits. - Paul M. Fahey; Siegfried R. Mader; Scott R. Stiffler; Rick L. Mohler; J. Daniel Mis; James A. Slinkman (IBM J. Res. Dev., 1992)