Incoming Work-In-Progress Prediction in Semiconductor Fabrication Foundry Using Long Short-Term Memory. - Tze Chiang Tin; Kang-Leng Chiew; Siew Chee Phang; San-Nah Sze; Pei San Tan (Comput. Intell. Neurosci., 2019)

A Realizable Overlay Virtual Metrology System in Semiconductor Manufacturing: Proposal, Challenges and Future Perspective. - Tze Chiang Tin; Saw Chin Tan; Hing Yong; Jimmy Ook Hyun Kim; Eric Ken Yong Teo; Ching Kwang Lee; Peter Than; Angela Pei San Tan; Siew Chee Phang (IEEE Access, 2021)

The Implementation of a Smart Sampling Scheme C2O Utilizing Virtual Metrology in Semiconductor Manufacturing. - Tze Chiang Tin; Saw Chin Tan; Hing Yong; Jimmy Ook Hyun Kim; Eric Ken Yong Teo; Joanne Ching Yee Wong; Ching Kwang Lee; Peter Than; Angela Pei San Tan; Siew Chee Phang (IEEE Access, 2021)