Role of two-dimensional electron gas (2DEG) in AlGaN/GaN high electron mobility transistor (HEMT) ON-state degradation. - Govindo J. Syaranamual; Wardhana A. Sasangka; Riko I. Made; Subramaniam Arulkumaran; Geok Ing Ng; Siew Chuen Foo; Chee Lip Gan; Carl V. Thompson (Microelectron. Reliab., 2016)