Subthreshold parameters of radio-frequency multi-finger nanometer MOS transistors. - Sik-Lam Siu; Hei Wong; Wing-Shan Tam; Kuniyuki Kakushima; Hiroshi Iwai (Microelectron. Reliab., 2009)

Off-state drain breakdown mechanisms of VDMOS with anti-JFET implantation. - Wing-Shan Tam; Sik-Lam Siu; Bing-Liang Yang; Chi-Wah Kok; Hei Wong (Microelectron. Reliab., 2011)

Degradation behaviors of GaN light-emitting diodes under high-temperature and high-current stressing. - J. Liu; Hei Wong; Sik-Lam Siu; Chi-Wah Kok; Valeriu Filip (Microelectron. Reliab., 2012)

Modeling of terminal ring structures for high-voltage power MOSFETs. - Wing-Shan Tam; Sik-Lam Siu; Oi-Ying Wong; Chi-Wah Kok; Hei Wong; Valeriu Filip (Microelectron. Reliab., 2012)

Thermal stability of sectorial split-drain magnetic field-effect transistors. - Wing-Shan Tam; Chi-Wah Kok; Sik-Lam Siu; Wing-Man Tang; Chi-Wah Leung; Hei Wong (Microelectron. Reliab., 2014)

Snapback breakdown ESD device based on zener diodes on silicon-on-insulator technology. - Wing-Shan Tam; Chi-Wah Kok; Sik-Lam Siu; Hei Wong (Microelectron. Reliab., 2014)