Impact of layout and channel processing on CMOS low frequency noise variability. - Fausto Simioni; Lorenzo Labate; Daniele Savio; Mariella Brizzi; Federica Ottogalli; Riccardo Marchetti; Silvia Brazzelli; Mattia Rossetti (ESSDERC, 2023)

Hot-Hole Gate Current and Degradation in N-Type Lateral Drift MOSFETs: Characterization and TCAD Analysis. - Luca Oldani; Silvia Brazzelli; Mattia Rossetti (IRPS, 2025)