Mechanisms of positive gate bias stress induced instabilities in power VDMOSFETs. - Ninoslav Stojadinovic; Ivica Manic; Snezana Djoric-Veljkovic; Vojkan Davidovic; Snezana Golubovic; Sima Dimitrijev (Microelectron. Reliab., 2001)

Mechanisms of spontaneous recovery in positive gate bias stressed power VDMOSFETs. - Ninoslav Stojadinovic; Ivica Manic; Snezana Djoric-Veljkovic; Vojkan Davidovic; Danijel Dankovic; Snezana Golubovic; Sima Dimitrijev (Microelectron. Reliab., 2002)

Effects of high electric field and elevated-temperature bias stressing on radiation response in power VDMOSFETs. - Ninoslav Stojadinovic; Ivica Manic; Snezana Djoric-Veljkovic; Vojkan Davidovic; Snezana Golubovic; Sima Dimitrijev (Microelectron. Reliab., 2002)

Advances in SiC power MOSFET technology. - Sima Dimitrijev; Philippe Jamet (Microelectron. Reliab., 2003)

Channel-carrier mobility parameters for 4H SiC MOSFETs. - Handoko Linewih; Sima Dimitrijev; Kuan Yew Cheong (Microelectron. Reliab., 2003)

a-Si: H Photodiode Using Alumina Thin Film Barrier. - Chang-Wu Hur; Sima Dimitrijev (J. Inform. and Commun. Convergence Engineering, 2005)

Effects of electrical stressing in power VDMOSFETs. - Ninoslav Stojadinovic; Ivica Manic; Vojkan Davidovic; Danijel Dankovic; Snezana Djoric-Veljkovic; Snezana Golubovic; Sima Dimitrijev (Microelectron. Reliab., 2005)

Face Recognition Using Local Binary Decisions. - Alex Pappachen James; Sima Dimitrijev (IEEE Signal Process. Lett., 2008)

Role of Resolution in Noisy Pattern Matching. - Alex Pappachen James; Sima Dimitrijev (BAIP, 2010)

Inter-image outliers and their application to image classification. - Alex Pappachen James; Sima Dimitrijev (Pattern Recognit., 2010)

Nearest Neighbor Classifier Based on Nearest Feature Decisions. - Alex Pappachen James; Sima Dimitrijev (Comput. J., 2012)

Cognitive Memory Network - Alex Pappachen James; Sima Dimitrijev (CoRR, 2012)

Feature selection using nearest attributes - Alex Pappachen James; Sima Dimitrijev (CoRR, 2012)

Examplers based image fusion features for face recognition - Alex Pappachen James; Sima Dimitrijev (CoRR, 2012)

Ranked selection of nearest discriminating features. - Alex Pappachen James; Sima Dimitrijev (Hum. centric Comput. Inf. Sci., 2012)

Active defects in MOS devices on 4H-SiC: A critical review. - Hamid Amini Moghadam; Sima Dimitrijev; Jisheng Han; Daniel Haasmann (Microelectron. Reliab., 2016)

Recognizing isolated words with minimum distance similarity metric padding. - Mitar Milacic; Alex Pappachen James; Sima Dimitrijev (J. Intell. Fuzzy Syst., 2017)

Analysis of Flat-Band-Voltage Dependent Breakdown Voltage for 10 nm Double Gate MOSFET. - Hak-Kee Jung; Sima Dimitrijev (J. Inform. and Commun. Convergence Engineering, 2018)

The Correct Equation for the Current Through Voltage-Dependent Capacitors. - Utkarsh Jadli; Faisal Mohd-Yasin; Hamid Amini Moghadam; Jordan R. Nicholls; Peyush Pande; Sima Dimitrijev (IEEE Access, 2020)

Measurement of Power Dissipation Due to Parasitic Capacitances of Power MOSFETs. - Utkarsh Jadli; Faisal Mohd-Yasin; Hamid Amini Moghadam; Peyush Pande; Jordan R. Nicholls; Sima Dimitrijev (IEEE Access, 2020)

Fast Near-Interface Traps in 4H-SiC MOS Capacitors Measured by an Integrated-Charge Method. - Mayank Chaturvedi; Sima Dimitrijev; Hamid Amini Moghadam; Daniel Haasmann; Peyush Pande; Utkarsh Jadli (IEEE Access, 2021)

Circuit-Specific and Technology-Independent Criterion for Selection of Power MOSFETs That Minimize Energy Dissipation. - Vikas Joshi; Utkarsh Jadli; Peyush Pande; Mayank Chaturvedi; Daniel Haasmann; Sima Dimitrijev (IEEE Access, 2023)