On-chip transistor characterization arrays with digital interfaces for variability characterization. - Simeon Realov; William F. McLaughlin; Kenneth L. Shepard (ISQED, 2009)

On-Chip Combined C-V/I-V Characterization System in 45-nm CMOS Technology. - Simeon Realov; Kenneth L. Shepard (IEEE J. Solid State Circuits, 2013)

A 100 fps, Time-Correlated Single-Photon-Counting-Based Fluorescence-Lifetime Imager in 130 nm CMOS. - Ryan M. Field; Simeon Realov; Kenneth L. Shepard (IEEE J. Solid State Circuits, 2014)

25.7 Time-Borrowing Fast Mux-D Scan Flip-Flop with On-Chip Timing/Power/VMIN Characterization Circuits in 10nm CMOS. - Amit Agarwal 001; Steven Hsu; Simeon Realov; Mark A. Anders 001; Gregory K. Chen; Monodeep Kar; Raghavan Kumar; Huseyin Sumbul; Phil C. Knag; Himanshu Kaul; Sanu Mathew; Mahesh Kumashikar; et al. (ISSCC, 2020)

Low-Clock-Power Digital Standard Cell IPs for High-Performance Graphics/AI Processors in 10nm CMOS. - Steven Hsu; Amit Agarwal 001; Simeon Realov; Mark A. Anders 001; Gregory K. Chen; Monodeep Kar; Raghavan Kumar; Huseyin Sumbul; Phil C. Knag; Himanshu Kaul; Vikram B. Suresh; Sanu Mathew; et al. (VLSI Circuits, 2020)