Multi-abstraction level signature generation and comparison based on radiation single event upset. - Christelle Hobeika; Simon Pichette; M. A. Leonard; Claude Thibeault; Jean-François Boland; Yves Audet (IOLTS, 2014)

On Delay Faults Affecting I/O Blocks of an SRAM-Based FPGA Due to Ionizing Radiations. - Fatima Zahra Tazi; Claude Thibeault; Yvon Savaria; Simon Pichette; Yves Audet (CoRR, 2014)

Knowledge-Intensive Diagnostics Using Case-Based Reasoning and Synthetic Case Generation. - Simon Pichette; Claude Thibeault (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2023)