Four point probe ramped voltage stress as an efficient method to understand breakdown of STT-MRAM MgO tunnel junctions. - Simon Van Beek; Koen Martens; Philippe Roussel; Gabriele Luca Donadio; Johan Swerts; Sofie Mertens; Gouri Sankar Kar; Tai Min; Guido Groeseneken (IRPS, 2015)

Study of breakdown in STT-MRAM using ramped voltage stress and all-in-one maximum likelihood fit. - Simon Van Beek; Philippe Roussel; Barry J. O'Sullivan; Robin Degraeve; Stefan Cosemans; Dimitri Linten; Gouri Sankar Kar (ESSDERC, 2018)

Experimental extraction of BEOL composite equivalent thermal conductivities for application in self-heating simulations. - Erik Bury; Ben Kaczer; Simon Van Beek; Dimitri Linten (ESSDERC, 2018)

Extended RVS characterisation of STT-MRAM devices: Enabling detection of AP/P switching and breakdown. - Barry J. O'Sullivan; Simon Van Beek; Philippe J. Roussel; Sidharth Rao; Wonsub Kim; S. Couet; Johan Swerts; Farrukh Yasin; Dimitri Crotti; Dimitri Linten; Gouri Sankar Kar (IRPS, 2018)

SOT-MRAM 300MM Integration for Low Power and Ultrafast Embedded Memories. - Kevin Garello; Kevin Garello Yasin; S. Couet; Laurent Souriau; Johan Swerts; Sidharth Rao; Simon Van Beek; Wonsub Kim; Enlong Liu; Shreya Kundu; Diana Tsvetanova; Kris Croes; et al. (VLSI Circuits, 2018)

SOT-MRAM 300mm integration for low power and ultrafast embedded memories. - Kevin Garello; Farrukh Yasin; S. Couet; Laurent Souriau; Johan Swerts; Sidharth Rao; Simon Van Beek; Wonsub Kim; Enlong Liu; Shreya Kundu; Diana Tsvetanova; N. Jossart; et al. (CoRR, 2018)

Array-Based Statistical Characterization of CMOS Degradation Modes and Modeling of the Time-Dependent Variability Induced by Different Stress Patterns in the {VG, VD} bias space. - Erik Bury; Adrian Vaisman Chasin; Michiel Vandemaele; Simon Van Beek; Jacopo Franco; Ben Kaczer; Dimitri Linten (IRPS, 2019)

Understanding and empirical fitting the breakdown of MgO in end-of-line annealed MTJs. - Simon Van Beek; Barry J. O'Sullivan; Sebastien Couet; Davide Crotti; Dimitri Linten; Gouri Sankar Kar (IRPS, 2020)

STT-MRAM array performance improvement through optimization of Ion Beam Etch and MTJ for Last-Level Cache application. - Sidharth Rao; Woojin Kim; Simon Van Beek; Shreya Kundu; Manu Perumkunnil; Stefan Cosemans; Farrukh Yasin; Sebastien Couet; Robert Carpenter; Barry J. O'Sullivan; Shamin H. Sharifi; N. Jossart; et al. (IMW, 2021)

Edge-induced reliability & performance degradation in STT-MRAM: an etch engineering solution. - Simon Van Beek; Siddharth Rao; Shreya Kundu; Woojin Kim; Barry J. O'Sullivan; Stefan Cosemans; Farrukh Yasin; Robert Carpenter; Sebastien Couet; Shamin H. Sharifi; Nico Jossart; Davide Crotti; et al. (IRPS, 2021)

MTJ degradation in SOT-MRAM by self-heating-induced diffusion. - Simon Van Beek; Kaiming Cai; Siddharth Rao; Ganesh Jayakumar; Sebastien Couet; Nico Jossart; Adrian Vaisman Chasin; Gouri Sankar Kar (IRPS, 2022)

Selective operations of multi-pillar SOT-MRAM for high density and low power embedded memories. - Kaiming Cai; Simon Van Beek; Siddharth Rao; K. Fan; M. Gupta; Van D. Nguyen; Ganesh Jayakumar; Giacomo Talmelli; S. Couet; Gouri Sankar Kar (VLSI Technology and Circuits, 2022)

STT-MRAM Stochastic and Defects-aware DTCO for Last Level Cache at Advanced Process Nodes. - Fernando García-Redondo; S. Rao; M. Gupta; Manu Perumkunnil; Y. Xiang; D. Abdi; Simon Van Beek; S. Couet; Marie Garcia Bardon (ESSDERC, 2023)

MTJ degradation in multi-pillar SOT-MRAM with selective writing. - Simon Van Beek; Kaiming Cai; Kaiquan Fan; Giacomo Talmelli; Anna Trovato; Nico Jossart; Siddharth Rao; Adrian Vaisman Chasin; Sebastien Couet (IRPS, 2023)

Extremely Scaled Perpendicular SOT-MRAM Array Integration on 300mm Wafer. - Farrukh Yasin; A. Palomino; A. Kumar; Valerio Pica; Simon Van Beek; Giacomo Talmelli; Van D. Nguyen; Stefan Cosemans; D. Crotti; Kurt Wostyn; Gouri Sankar Kar; Sebastien Couet (VLSI Technology and Circuits, 2024)

Dielectric Breakdown Analysis on Bottom and Top-Gated IGZO-TFT. - Simon Van Beek; Adrian Vaisman Chasin; Subhali Subhechha; Harold Dekkers; Nouredine Rassoul; Yiqun Wan; Hongwei Tang; Joao P. Bastos; Attilio Belmonte; Gouri Sankar Kar (IRPS, 2025)