Investigation on ESD-stressed GaN/InGaN-on-sapphire blue LEDs. - Gaudenzio Meneghesso; Simona Podda; Massimo Vanzi (Microelectron. Reliab., 2001)

A specimen-current branching approach for FA of long Electromigration test lines. - C. Caprile; Ilaria De Munari; Maurizio Impronta; Simona Podda; Andrea Scorzoni; Massimo Vanzi (Microelectron. Reliab., 2002)

An automated lifetest equipment for optical emitters. - M. Giglio; G. Martines; Giovanna Mura; Simona Podda; Massimo Vanzi (Microelectron. Reliab., 2002)

Backside Failure Analysis of GaAs ICs after ESD tests. - Gaudenzio Meneghesso; A. Cocco; Giovanna Mura; Simona Podda; Massimo Vanzi (Microelectron. Reliab., 2002)

ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology. - Luca Sponton; Lorenzo Cerati; Giuseppe Croce; Giovanna Mura; Simona Podda; Massimo Vanzi; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2002)

Reliability of visible GaN LEDs in plastic package. - Gaudenzio Meneghesso; S. Levada; Enrico Zanoni; Gaetano Scamarcio; Giovanna Mura; Simona Podda; Massimo Vanzi; S. Du; I. Eliashevich (Microelectron. Reliab., 2003)

Quantitative 3D reconstruction from BS imaging. - Ruggero Pintus; Simona Podda; Francesca Mighela; Massimo Vanzi (Microelectron. Reliab., 2004)

Failure Analysis of RuO2 Thick Film Chip Resistors. - Simona Podda; G. Cassanelli; Fausto Fantini; Massimo Vanzi (Microelectron. Reliab., 2004)

Image alignment for 3D reconstruction in a SEM. - Ruggero Pintus; Simona Podda; Massimo Vanzi (Microelectron. Reliab., 2005)

High brightness GaN LEDs degradation during dc and pulsed stress. - Matteo Meneghini; Simona Podda; A. Morelli; Ruggero Pintus; L. Trevisanello; Gaudenzio Meneghesso; Massimo Vanzi; Enrico Zanoni (Microelectron. Reliab., 2006)

An Automatic Alignment Procedure for a Four-Source Photometric Stereo Technique Applied to Scanning Electron Microscopy. - Ruggero Pintus; Simona Podda; Massimo Vanzi (IEEE Trans. Instrum. Meas., 2008)

XEBIC at the Dual Beam. - Massimo Vanzi; Simona Podda; Elodia Musu; Robert Cao (Microelectron. Reliab., 2013)