Degradation induced by 2-MeV alpha particles on AlGaN/GaN high electron mobility transistors. - Francesca Danesin; Franco Zanon; Simone Gerardin; Fabiana Rampazzo; Gaudenzio Meneghesso; Enrico Zanoni; Alessandro Paccagnella (Microelectron. Reliab., 2006)

Degradation of static and dynamic behavior of CMOS inverters during constant and pulsed voltage stress. - Simone Gerardin; Alessio Griffoni; Andrea Cester; Alessandro Paccagnella; G. Ghidini (Microelectron. Reliab., 2006)

Sensitivity Evaluation of TMR-Hardened Circuits to Multiple SEUs Induced by Alpha Particles in Commercial SRAM-Based FPGAs. - Andrea Manuzzato; Paolo Rech; Simone Gerardin; Alessandro Paccagnella; Luca Sterpone; Massimo Violante (DFT, 2007)

Single Event Effects in 1Gbit 90nm NAND Flash Memories under Operating Conditions. - Marta Bagatin; Giorgio Cellere; Simone Gerardin; Alessandro Paccagnella; Angelo Visconti; Silvia Beltrami; M. Maccarrone (IOLTS, 2007)

Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs. - Javier Martín-Martínez; Simone Gerardin; Rosana Rodríguez; Montserrat Nafría; Xavier Aymerich; Andrea Cester; Alessandro Paccagnella; G. Ghidini (Microelectron. Reliab., 2007)

On the Evaluation of Radiation-Induced Transient Faults in Flash-Based FPGAs. - Niccolò Battezzati; Simone Gerardin; Andrea Manuzzato; Alessandro Paccagnella; Sana Rezgui; Luca Sterpone; Massimo Violante (IOLTS, 2008)

Evaluating Alpha-induced soft errors in embedded microprocessors. - Paolo Rech; Simone Gerardin; Alessandro Paccagnella; Paolo Bernardi; Michelangelo Grosso; Matteo Sonza Reorda; Davide Appello (IOLTS, 2009)

DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study. - Davide Appello; Paolo Bernardi; Simone Gerardin; Michelangelo Grosso; Alessandro Paccagnella; Paolo Rech; Matteo Sonza Reorda (VTS, 2009)

Destructive events in NAND Flash memories irradiated with heavy ions. - Marta Bagatin; Simone Gerardin; Alessandro Paccagnella; Giorgio Cellere; F. Irom; D. N. Nguyen (Microelectron. Reliab., 2010)

Impact of total dose on heavy-ion upsets in floating gate arrays. - Simone Gerardin; Marta Bagatin; Alessandro Paccagnella; G. Cellere; Angelo Visconti; Mauro Bonanomi (Microelectron. Reliab., 2010)

High-reliability fault tolerant digital systems in nanometric technologies: Characterization and design methodologies. - Cristiana Bolchini; Antonio Miele; Chiara Sandionigi; Marco Ottavi; Salvatore Pontarelli; Adelio Salsano; Cecilia Metra; Martin Omaña 001; Daniele Rossi 001; Matteo Sonza Reorda; Luca Sterpone; Massimo Violante; et al. (DFT, 2012)

Temperature dependence of neutron-induced soft errors in SRAMs. - Marta Bagatin; Simone Gerardin; Alessandro Paccagnella; Carla Andreani; Giuseppe Gorini; Christopher D. Frost (Microelectron. Reliab., 2012)

Degradation of dc and pulsed characteristics of InAlN/GaN HEMTs under different proton fluences. - Isabella Rossetto; Fabiana Rampazzo; Simone Gerardin; Matteo Meneghini; Marta Bagatin; Alberto Zanandrea; Alessandro Paccagnella; Gaudenzio Meneghesso; Enrico Zanoni; Christian Dua; Marie-Antoinette di Forte-Poisson; Raphael Aubry; et al. (ESSDERC, 2014)

Proton induced trapping effect on space compatible GaN HEMTs. - Antonio Stocco; Simone Gerardin; Davide Bisi; Stefano Dalcanale; Fabiana Rampazzo; Matteo Meneghini; Gaudenzio Meneghesso; Jan Grünenpütt; Benoit Lambert; Hervé Blanck; Enrico Zanoni (Microelectron. Reliab., 2014)

CHIPIX65: Developments on a new generation pixel readout ASIC in CMOS 65 nm for HEP experiments. - N. Demaria; G. Dellacasa; G. Mazza; Angelo Rivetti; Manuel D. Da Rocha Rolo; E. Monteil; L. Pacher; Fabio Ciciriello; Francesco Corsi; Cristoforo Marzocca; G. De Roberts; F. Loddo; et al. (IWASI, 2015)

Soft errors in floating gate memory cells: A review. - Marta Bagatin; Simone Gerardin (Microelectron. Reliab., 2015)

1GigaRad TID impact on 28 nm HEP analog circuits. - Federica Resta; Simone Gerardin; S. Mattiazzo; Alessandro Paccagnella; Marcello De Matteis; Christian C. Enz; Andrea Baschirotto (Integr., 2018)

Single Phase Clock Based Radiation Tolerant D Flip-flop Circuit. - Abhishek Jain 003; Andrea Veggetti 001; Dennis Crippa; Antonio Benfante; Simone Gerardin; Marta Bagatin (IOLTS, 2020)

First Tests of a New Facility for Device-Level, Board-Level and System-Level Neutron Irradiation of Microelectronics. - Carlo Cazzaniga; Marta Bagatin; Simone Gerardin; Alessandra Costantino; Christopher D. Frost (IEEE Trans. Emerg. Top. Comput., 2021)

Radiation Tolerant Multi-Bit Flip-Flop System With Embedded Timing Pre-Error Sensing. - Abhishek Jain 003; Andrea Mario Veggetti; Dennis Crippa; Antonio Benfante; Simone Gerardin; Marta Bagatin (IEEE J. Solid State Circuits, 2022)